A Designer’s Guide to Built-In Self-Test (Frontiers in by Charles E. Stroud

By Charles E. Stroud

A contemporary technological develop is the artwork of designing circuits to check themselves, known as a integrated Self-Test. This e-book is written from a designer's point of view and describes the most important BIST methods which were proposed and carried out, in addition to their merits and boundaries.

Show description

Read or Download A Designer’s Guide to Built-In Self-Test (Frontiers in Electronic Testing) PDF

Best counseling books

Positive Psychology and Family Therapy: Creative Techniques and Practical Tools for Guiding Change and Enhancing Growth

An asserting advisor equipping kin therapists to successfully comprise optimistic psychology inside of their practices the next move within the evolution of relations remedy, optimistic psychology has enabled relations therapists to assist families—whatever their form—to construct upon their strengths, triumph over disorder, and flow to new degrees of concord and thriving.

Law and Youth Work

This booklet deals a realistic and easy method of knowing how the legislations protects, empowers and regulates younger people's lives. the consequences for the pro adolescence employee of a variety of dilemmas are thought of. staff are inspired to contemplate what's intended by way of rights and, via sensible examples, to check their very own ideals and moral codes, quite the place they clash with demonstrated principles.

The Professional Counselor's Desk Reference, Second Edition

"This publication includes a lot precious info, together with specialist perform, ethics, cultural issues, evaluation, and intervention. it will be an excellent addition to the libraries of scholars and execs alike. .. ranking: ninety seven - five Stars! " --Gary B. Kaniuk, PsyD, Cermak future health providers, Doody's studies compliment for the 1st version "Marini and Stebnicki have compiled an exceptionally invaluable and sensible counseling source protecting a number of subject matters.

Extra resources for A Designer’s Guide to Built-In Self-Test (Frontiers in Electronic Testing)

Example text

This algorithm provides the basic idea behind many ATPG programs [4]. The algorithm can also be used to sensitize a path through combinational logic for delay fault testing. The basic algorithm is performed as follows: Step 1: At Step Step Step 34 the fault site, assign the logic value opposite to that of the stuck-at fault. This step is referred to as fault sensitization or fault activation. 2: From the fault site, choose a path to a primary output, assigning non-controlling logic values to all other inputs (referred to as off-path inputs) to gates in that path (1 = non-controlling logic value for AND/NAND gates and 0 = noncontrolling logic value for OR/NOR gates).

The transistor-level stuck fault model allows any transistor to be either stuckon (also referred to as stuck-short) or stuck-off (also referred to as stuck-open). 4 illustrates the emulation of the transistor-level stuck fault model in a 2input CMOS NOR gate. 4a gives the fault-free transistor-level diagram for the 2-input NOR gate. 4b). 4c (where the A-input N-channel MOSFET has been removed). Alternatively, stuck-on faults can be emulated by disconnecting the gate of the MOSFET from the signal net and connecting it to a logic 1 for N-channel transistors (NFETs) or to a logic 0 for Pchannel transistors (PFETs) such that the transistor is always conducting.

2 Fault Models and Detection To effectively evaluate the quality of a set of tests for a product, as well as to evaluate the effectiveness of a BIST approach in its application to that product, fault models are required for emulation of faults or defects in a simulation environment. The first requirement of a good fault model is that it accurately reflects the behavior of the actual defects that can occur during the fabrication and manufacturing processes as well as the behavior of faults that can occur during the operation of the system.

Download PDF sample

Rated 4.49 of 5 – based on 20 votes